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Test: IGBTs - Electrical Engineering (EE) MCQ


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20 Questions MCQ Test - Test: IGBTs

Test: IGBTs for Electrical Engineering (EE) 2024 is part of Electrical Engineering (EE) preparation. The Test: IGBTs questions and answers have been prepared according to the Electrical Engineering (EE) exam syllabus.The Test: IGBTs MCQs are made for Electrical Engineering (EE) 2024 Exam. Find important definitions, questions, notes, meanings, examples, exercises, MCQs and online tests for Test: IGBTs below.
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Test: IGBTs - Question 1

 IGBT possess

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Like MOSFET IGBT possess high input impedance.

Test: IGBTs - Question 2

 IGBT & BJT both posses ___

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Low on state power loss is one of the best parameters of both BJT & the IGBT.

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Test: IGBTs - Question 3

The three terminals of the IGBT are

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IGBT is a three terminal device. It has a gate, a emitter & a collector.

Test: IGBTs - Question 4

 In IGBT, the p+ layer connected to the collector terminal is called as the

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 It is called as a injection layer, because it injects holes into the n layer.

Test: IGBTs - Question 5

The controlling parameter in IGBT is the

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The controlling parameter is the gate to emitter voltage, as the device is a voltage controlled device.

Test: IGBTs - Question 6

 In IGBT, the n layer above the p+ layer is called as the

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 It is called as the drift layer because its thickness determines the voltage blocking capabilities of the device.

Test: IGBTs - Question 7

The voltage blocking capability of the IGBT is determined by the

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 The drift layer which is a n layer determines the voltage blocking capabilities.

Test: IGBTs - Question 8

 The controlled parameter in IGBT is the

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The controlling parameter is the gate to collector current.

Test: IGBTs - Question 9

The structure of the IGBT is a

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The IGBT is a semiconductor device with four alternating layers (P-N-P-N) that are controlled by a metal-oxide-semiconductor (MOS) gate structure without regenerative action.

Test: IGBTs - Question 10

 The major drawback of the first generation IGBTs was that, they had

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The earlier IGBT’s had latch-up problems (device cannot turn off even after the gate signal is removed), and secondary breakdown problems (in which a localized hotspot in the device goes into thermal runaway and burns the device out at high currents).

Test: IGBTs - Question 11

When latch-up occurs in an IGBT

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After latch-up the collector emitter current is no longer in control of the gate terminal.

Test: IGBTs - Question 12

A latched up IGBT can be turned off by

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 Forced commutation of current is the only way to turn off a latched up IGBT.

Test: IGBTs - Question 13

The static V-I curve of an IGBT is plotted with

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V-I curves are plotted for Ic vs Vce with the controlling parameter (Vge) as a parameter.

Test: IGBTs - Question 14

Latch-up occurs in an IGBT when

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Latch up occurs when the current through the device (Ic) collector current increases beyond a certain value.

Test: IGBTs - Question 15

 In an IGBT, during the turn-on time

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Vce decreases from 0.9 to 0.1 of the initial value whereas others increase.

Test: IGBTs - Question 16

Choose the correct statement

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Due to its high gate impedance, IGBTs require less gate drive current.

Test: IGBTs - Question 17

The approximate equivalent circuit of an IGBT consists of

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Gate of the MOSFET forms the gate terminal of the IGBT, the source of MOSFET is connected to the base of the BJT and drain to the collector.

Test: IGBTs - Question 18

An IGBT is also know as

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All of the above mentioned are alternate names of IGBTs.

Test: IGBTs - Question 19

The body of an IGBT consists of a

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IGBT has a p-n-p structure with fingers of n+ layers into the p layer. The p layer has the largest cross section and forms the body of the IGBT.

Test: IGBTs - Question 20

At present, the state-of-the-art semiconductor devices are begin manufactured using

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All of the above mentioned can be used but Si-Ca has certain advantages over the other materials.

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