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Test: Memory Cells


10 Questions MCQ Test VLSI System Design | Test: Memory Cells


Description
This mock test of Test: Memory Cells for Electrical Engineering (EE) helps you for every Electrical Engineering (EE) entrance exam. This contains 10 Multiple Choice Questions for Electrical Engineering (EE) Test: Memory Cells (mcq) to study with solutions a complete question bank. The solved questions answers in this Test: Memory Cells quiz give you a good mix of easy questions and tough questions. Electrical Engineering (EE) students definitely take this Test: Memory Cells exercise for a better result in the exam. You can find other Test: Memory Cells extra questions, long questions & short questions for Electrical Engineering (EE) on EduRev as well by searching above.
QUESTION: 1

Which method is used to determine structural defects?

Solution:

Deterministic test pattern are used to detect specific faults or structural faults for a circuit under test.

QUESTION: 2

Which is known as stored test pattern method?

Solution:

Deterministic test pattern method is also known as stored test pattern method in the context of BIST applications.

QUESTION: 3

Which method uses finite state machine for developing the test pattern?

Solution:

Algorithmic test pattern method uses the hardware finite state machine for generating algorithmic test vectors for the circuit under test.

QUESTION: 4

A n-bit counter produces ______ number of total input combinations
Solution:

A n-bit counter produces totally 2^n number of all possible input combinations for testing the circuit under test and it is called as exhaustive test pattern method.

QUESTION: 5

 Exhaustive test pattern determines
Solution:

Exhaustive test pattern method detects all gate level struck-at fault and also bridging fault.

QUESTION: 6

 Exhaustive test pattern also detects delay faults.
Solution:

Exhaustive test pattern method does not detect all transistor level faults or delay faults since those faults needs specific ordering.

QUESTION: 7

 Which is not suitable for circuits having large N values?
Solution:

 Exhaustive test pattern method is not suitable for circuit having large N values since there is a limit for fault coverage.

QUESTION: 8

 Which method needs fault simulation?
Solution:

 Exhaustive test pattern method needs fault simulation for determining fault coverage where as pseudo-exhaustive test pattern method does not need fault simulation.

QUESTION: 9

 In which method sequences are repeatable?
Solution:

Pseudo-random test pattern method have properties similar to random pattern sequence but the sequence are repeatable.

QUESTION: 10

Which method is used for external functional testing?
Solution:

Random test pattern method is used for external functional testing of microprocessors as well as in ATPG software.

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