# Test: Memory Cells

## 10 Questions MCQ Test VLSI System Design | Test: Memory Cells

Description
Attempt Test: Memory Cells | 10 questions in 10 minutes | Mock test for Electrical Engineering (EE) preparation | Free important questions MCQ to study VLSI System Design for Electrical Engineering (EE) Exam | Download free PDF with solutions
QUESTION: 1

### Which method is used to determine structural defects?

Solution:

Deterministic test pattern are used to detect specific faults or structural faults for a circuit under test.

QUESTION: 2

### Which is known as stored test pattern method?

Solution:

Deterministic test pattern method is also known as stored test pattern method in the context of BIST applications.

QUESTION: 3

### Which method uses finite state machine for developing the test pattern?

Solution:

Algorithmic test pattern method uses the hardware finite state machine for generating algorithmic test vectors for the circuit under test.

QUESTION: 4

A n-bit counter produces ______ number of total input combinations

Solution:

A n-bit counter produces totally 2^n number of all possible input combinations for testing the circuit under test and it is called as exhaustive test pattern method.

QUESTION: 5

Exhaustive test pattern determines

Solution:

Exhaustive test pattern method detects all gate level struck-at fault and also bridging fault.

QUESTION: 6

Exhaustive test pattern also detects delay faults.

Solution:

Exhaustive test pattern method does not detect all transistor level faults or delay faults since those faults needs specific ordering.

QUESTION: 7

Which is not suitable for circuits having large N values?

Solution:

Exhaustive test pattern method is not suitable for circuit having large N values since there is a limit for fault coverage.

QUESTION: 8

Which method needs fault simulation?

Solution:

Exhaustive test pattern method needs fault simulation for determining fault coverage where as pseudo-exhaustive test pattern method does not need fault simulation.

QUESTION: 9

In which method sequences are repeatable?

Solution:

Pseudo-random test pattern method have properties similar to random pattern sequence but the sequence are repeatable.

QUESTION: 10

Which method is used for external functional testing?

Solution:

Random test pattern method is used for external functional testing of microprocessors as well as in ATPG software.

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