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Test: Storage Elements - Electrical Engineering (EE) MCQ


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20 Questions MCQ Test - Test: Storage Elements

Test: Storage Elements for Electrical Engineering (EE) 2024 is part of Electrical Engineering (EE) preparation. The Test: Storage Elements questions and answers have been prepared according to the Electrical Engineering (EE) exam syllabus.The Test: Storage Elements MCQs are made for Electrical Engineering (EE) 2024 Exam. Find important definitions, questions, notes, meanings, examples, exercises, MCQs and online tests for Test: Storage Elements below.
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Test: Storage Elements - Question 1

 Which clock is preferred in storage devices?

Detailed Solution for Test: Storage Elements - Question 1

 Two phase non-overlapping clock signal is easily available and works better and effectively and this clock will be used throughout storage system.

Test: Storage Elements - Question 2

Clock signal Φ2 is to

Detailed Solution for Test: Storage Elements - Question 2

 Bits or data written into storage elements may be assumed to be settled before the immediately following signal Φ2 refreshes stored data where appropriate.

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Test: Storage Elements - Question 3

Data is read

Detailed Solution for Test: Storage Elements - Question 3

Bits or data may be read from storage elements on the next of Φ1 clock signal that is read signals RD are Anded with Φ1.

Test: Storage Elements - Question 4

Factor for assessment of storage elements are

Detailed Solution for Test: Storage Elements - Question 4

Some of the comparative assessment factor for storage elements are area requirement, estimated dissipation per bit stored and volatility.

Test: Storage Elements - Question 5

Which occupies lesser area?

Detailed Solution for Test: Storage Elements - Question 5

nMOS design with buried contacts needs lesser area than CMOS design and this can be estimated by calculating space stored by each bit in register cell.

Test: Storage Elements - Question 6

In which design, dissipation is less?

Detailed Solution for Test: Storage Elements - Question 6

In CMOS design, static dissipation is very small since only the switching dissipation will be significant particularly at high speeds.

Test: Storage Elements - Question 7

 The impedance of pull down transistor in nMOS can be given as

Detailed Solution for Test: Storage Elements - Question 7

Each inverter stage has 8:1 ratio and in nMOS register cell, atleast one inverter should always be on and Zp.u. is given as 4Rs and Zp.d. is given as 1/2Rs.

Test: Storage Elements - Question 8

 Data storage time is

Detailed Solution for Test: Storage Elements - Question 8

Data is stored by the charge on the gate capacitance of each inverter stage, so that data storage time is limited to 1 msec or less.

Test: Storage Elements - Question 9

A bit is read at T1 when

Detailed Solution for Test: Storage Elements - Question 9

 With RD control line low, a bit can be read through clock period T1 when WR is made high. After reading the bit WR is made low.

Test: Storage Elements - Question 10

A bit can be stored when

Detailed Solution for Test: Storage Elements - Question 10

A bit value is stored for some time by Cg of time period T2 while both RD and WR are made low.

Test: Storage Elements - Question 11

Current flows only when

Detailed Solution for Test: Storage Elements - Question 11

Current flows only when RD is high and 1 is stored. Thus static dissipating is nil.

Test: Storage Elements - Question 12

Overhead bits are used for sensing.

Detailed Solution for Test: Storage Elements - Question 12

Overhead bits are used for sensing. Some amount of over head bits are used in one transisrot dynamic memory cell.

Test: Storage Elements - Question 13

Reading a cell is a _______ operation

Detailed Solution for Test: Storage Elements - Question 13

Reading a cell is a detructive operation and the stored bit must be rewritten everytime it is read.

Test: Storage Elements - Question 14

 RAM is a _____ cell

Detailed Solution for Test: Storage Elements - Question 14

RAM is a pseudo static cell. It stores data indefinitely and refreshing is not necessary.

Test: Storage Elements - Question 15

Pseudo static RAM cell is built using

Detailed Solution for Test: Storage Elements - Question 15

 Pseudo static RAM cell is built using two inverters and data can be stored in these two inverters by connecting it in parallel and using a feedback.

Test: Storage Elements - Question 16

Cells must be non stackable in RAM storage cell.

Detailed Solution for Test: Storage Elements - Question 16

Cells must be stackable, both side by side and from top to bottom. This must be carefully considered when layout is made.

Test: Storage Elements - Question 17

Which cell is non volatile?

Detailed Solution for Test: Storage Elements - Question 17

Pseudo static RAM cell is a non volatile cell. It is used for long time storage. Non volatile memory is also called as long term memory.

Test: Storage Elements - Question 18

In RAM arrays, transistor is of

Detailed Solution for Test: Storage Elements - Question 18

 In RAM arrays, transistor is of minimum size and thus it is incapable of sinking large charges quickly.

Test: Storage Elements - Question 19

Which implementation is slower?

Detailed Solution for Test: Storage Elements - Question 19

 NOR gate implementation is slower even though both NAND and NOR gate implementation is suitable for CMOS.

Test: Storage Elements - Question 20

FOR nMOS which implementation is not suitable?

Detailed Solution for Test: Storage Elements - Question 20

 In nMOS, NAND gate implementation is impractical because of the large number of gate requiring three or more inputs.

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