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Test: Design Of ALU Subsystem - Electrical Engineering (EE) MCQ


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10 Questions MCQ Test - Test: Design Of ALU Subsystem

Test: Design Of ALU Subsystem for Electrical Engineering (EE) 2024 is part of Electrical Engineering (EE) preparation. The Test: Design Of ALU Subsystem questions and answers have been prepared according to the Electrical Engineering (EE) exam syllabus.The Test: Design Of ALU Subsystem MCQs are made for Electrical Engineering (EE) 2024 Exam. Find important definitions, questions, notes, meanings, examples, exercises, MCQs and online tests for Test: Design Of ALU Subsystem below.
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Test: Design Of ALU Subsystem - Question 1

 Design gives the detailed

Detailed Solution for Test: Design Of ALU Subsystem - Question 1

Design is largely a matter of topology of communication rather than the detailed logic circuit design.

Test: Design Of ALU Subsystem - Question 2

To minimize the design effort, regularity should be

Detailed Solution for Test: Design Of ALU Subsystem - Question 2

Regularity is a qualitatie parameter and it should be high as possible to minimize the design effort required for any system.

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Test: Design Of ALU Subsystem - Question 3

Regularity is the ratio of

Detailed Solution for Test: Design Of ALU Subsystem - Question 3

Regularity is the ratio of total transistors in the chip to total transistors that must be designed in detail.

Test: Design Of ALU Subsystem - Question 4

 Good design system has regularity in the range of

Detailed Solution for Test: Design Of ALU Subsystem - Question 4

Good design system must have regularity in the range of 50 to 100 or more and regular structures such as memories achieve very high figures.

Test: Design Of ALU Subsystem - Question 5

 In the adder, sum is stored in

Detailed Solution for Test: Design Of ALU Subsystem - Question 5

The sum is stored in parallel at the output of the adder from where it may be fed through the shifter and back to the register array.

Test: Design Of ALU Subsystem - Question 6

The shifter must be connected to

Detailed Solution for Test: Design Of ALU Subsystem - Question 6

 The shifter is unclocked but must be connected to 4 shift control lines. Carry out and Carry in signal must also be connected.

Test: Design Of ALU Subsystem - Question 7

What is the sum and carry if the two bit number is 1 1 and the previous carry is 0?

Detailed Solution for Test: Design Of ALU Subsystem - Question 7

 If the two bit number is 1 1 and the previous carry is 0 the sum is 0 and carry is 1. This can be obtained by first adding the two numbers 1 and 1. Sum will be 0 and carry is 1. Later add the previous carry 0 to it. Now the sum is finally 0 and final carry will be 1.

Test: Design Of ALU Subsystem - Question 8

 Which design is preferred in n-bit adder?

Detailed Solution for Test: Design Of ALU Subsystem - Question 8

 In n-bit adder, n adder elements must be cascaded with carry out connecting to carry in. This carry chain will have more pass transistors connected in series which will give slow response. Thus suitable buffer can be used in between.

Test: Design Of ALU Subsystem - Question 9

 In adders, the previous carry can also be given by

Detailed Solution for Test: Design Of ALU Subsystem - Question 9

 In adders, the previous carry signal can also be given using propogate signal pk which is ex-or of two bits ak and bk and also using generate signal gk which is ‘and’ of ak and bk.

Test: Design Of ALU Subsystem - Question 10

Adder using ____ technology can be used for speed improvement

Detailed Solution for Test: Design Of ALU Subsystem - Question 10

Using BiCMOS technology, speed improvement can be obtained by a factor of two over CMOS technology. This arrangement works will lower input voltage swings to achieve higher speed.

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