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Electrical Engineering (EE) Exam  >  Electrical Engineering (EE) Tests  >  Test: Noise In MOS Device - Electrical Engineering (EE) MCQ

Test: Noise In MOS Device - Electrical Engineering (EE) MCQ


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10 Questions MCQ Test - Test: Noise In MOS Device

Test: Noise In MOS Device for Electrical Engineering (EE) 2024 is part of Electrical Engineering (EE) preparation. The Test: Noise In MOS Device questions and answers have been prepared according to the Electrical Engineering (EE) exam syllabus.The Test: Noise In MOS Device MCQs are made for Electrical Engineering (EE) 2024 Exam. Find important definitions, questions, notes, meanings, examples, exercises, MCQs and online tests for Test: Noise In MOS Device below.
Solutions of Test: Noise In MOS Device questions in English are available as part of our course for Electrical Engineering (EE) & Test: Noise In MOS Device solutions in Hindi for Electrical Engineering (EE) course. Download more important topics, notes, lectures and mock test series for Electrical Engineering (EE) Exam by signing up for free. Attempt Test: Noise In MOS Device | 10 questions in 10 minutes | Mock test for Electrical Engineering (EE) preparation | Free important questions MCQ to study for Electrical Engineering (EE) Exam | Download free PDF with solutions
Test: Noise In MOS Device - Question 1
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Noise in VLSI circuits mean:

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In VLSI circuits noise limits the minimum signal level that a circuit process with acceptable quality.

Test: Noise In MOS Device - Question 2
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In probability Noise is described as :

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 Noise is a Random Process.

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Test: Noise In MOS Device - Question 3
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Noise generated by independent devices are:

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Noise generated by independent devices are uncorrelated, eg: noise generated from resistor is not similar to noise generated from transistor.

Test: Noise In MOS Device - Question 4
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The 2 types of noise that the analog systems face during signal processing are:
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Device electronic noise and environmental noise affects signal processing of analog signals.

Test: Noise In MOS Device - Question 5
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Thermal noise is generated from:
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Thermal noise is due to random motion of electrons in a conductor.

Test: Noise In MOS Device - Question 6
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Thermal noise is generated from MOSFET by:
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Thermal noise is generated due to conduction of charge carriers in the channel.

Test: Noise In MOS Device - Question 7
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Thermal noise current in the MOSFET is proportional to:
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 Noise current I^2 = 4kTygm

Test: Noise In MOS Device - Question 8
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Flicker noise is found in MOSFET at:
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The interface between Gate oxide and silicon substrate generates flicker noise.

Test: Noise In MOS Device - Question 9
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Flicker noise originate due to:
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 Dangling bonds generate flicker noise.

Test: Noise In MOS Device - Question 10
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The average power of flicker noise depends on:
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 Depending on the Cleanness of oxide silicon interface flicker noise varies.

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