You can prepare effectively for Electronics and Communication Engineering (ECE) GATE ECE (Electronics) Mock Test Series 2027 with this dedicated MCQ Practice Test (available with solutions) on the important topic of "Test: Electronic Devices - 1". These 10 questions have been designed by the experts with the latest curriculum of Electronics and Communication Engineering (ECE) 2026, to help you master the concept.
Test Highlights:
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Read the following statements regarding semiconductor and mark the incorrect answer.
Detailed Solution: Question 1
Detailed Solution: Question 2
Semiconductors have ______ conduction band and ______ valence band.
Detailed Solution: Question 3
Hole mobility in Ge at room temperature is 1900 cm2/V-sec. The diffusion coefficient is ________cm2/sec.
(Write answer to one decimal point.)
(Take kT = 25 mV)
Detailed Solution: Question 4
The Difference between the donor energy level and fermi level in a n-type semiconductor in where 25% of the atoms are ionised at 300 k is:
Detailed Solution: Question 5
A semiconductor with intrinsic carrier concentration 1 × 1010 cm-3 at 300°K has both valence and conduction band effective densities of states NC and NV equal to 1019 cm-3. The band gap Eg is _____ eV. (Write answer to one decimal point.)
Detailed Solution: Question 6
In a very long p-type Si bar with doping concentration Na = 1017 cm-3, excess holes are injected such that excessive concentration of holes at x = 0 is 5 × 1016 cm-3. The hole concentration at x = 1 μm is _____ × 1017 cm-3. Take μp = 500 cm2/v-s and recombination time constant τp = 10-8 s, kT = 0.0259 eV (Write answer to two decimal point.)
Detailed Solution: Question 7
In an intrinsic semiconductor, the Fermi energy level EF doesn’t lie in the middle of the band gap cause:
Detailed Solution: Question 8
A silicon bar is doped with donor impurities ND = 2.25 × 1015 cm-3. If the electron mobility μn = 1000 cm2/v-s then the approximate value of resistivity of silicon bar assuming partial ionization of 55% is __________ (Ω - cm)
Detailed Solution: Question 9
Holes are injected into n-type Ge so that the at the surface of the semiconductor hole concentration is 1014/cm3. If diffusion constant of a hole in Ge is 49cm2/sec and minority carrier lifetime is τp = 10-3 sec. Then the hole concentration Δp at a distance of 4mm from the surface is ______1014/cm3.
Detailed Solution: Question 10
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