Electrical Engineering (EE) Exam  >  Electrical Engineering (EE) Tests  >  Test: Electronic Devices & Circuits - 6 - Electrical Engineering (EE) MCQ

Test: Electronic Devices & Circuits - 6 - Electrical Engineering (EE) MCQ


Test Description

25 Questions MCQ Test - Test: Electronic Devices & Circuits - 6

Test: Electronic Devices & Circuits - 6 for Electrical Engineering (EE) 2024 is part of Electrical Engineering (EE) preparation. The Test: Electronic Devices & Circuits - 6 questions and answers have been prepared according to the Electrical Engineering (EE) exam syllabus.The Test: Electronic Devices & Circuits - 6 MCQs are made for Electrical Engineering (EE) 2024 Exam. Find important definitions, questions, notes, meanings, examples, exercises, MCQs and online tests for Test: Electronic Devices & Circuits - 6 below.
Solutions of Test: Electronic Devices & Circuits - 6 questions in English are available as part of our course for Electrical Engineering (EE) & Test: Electronic Devices & Circuits - 6 solutions in Hindi for Electrical Engineering (EE) course. Download more important topics, notes, lectures and mock test series for Electrical Engineering (EE) Exam by signing up for free. Attempt Test: Electronic Devices & Circuits - 6 | 25 questions in 25 minutes | Mock test for Electrical Engineering (EE) preparation | Free important questions MCQ to study for Electrical Engineering (EE) Exam | Download free PDF with solutions
Test: Electronic Devices & Circuits - 6 - Question 1

In P-N junction, the region containing the uncompensated acceptor and donor ions is called

Test: Electronic Devices & Circuits - 6 - Question 2

In a photodiode the current is due to

1 Crore+ students have signed up on EduRev. Have you? Download the App
Test: Electronic Devices & Circuits - 6 - Question 3

Consider the following statements

  1. Acceptor level lies close the valence band.
  2. Donor level lies close to the valence band.
  3. n type semiconductor behaves as an insulator at 0 K.
  4. p type semiconductor behaves as an insulator at 0 K.
Of these statements:

Test: Electronic Devices & Circuits - 6 - Question 4

If the temperature of on extrinsic semiconductor is increased so that the intrinsic carrier concentration is doubled, then

Test: Electronic Devices & Circuits - 6 - Question 5

Assertion (A): The conductivity of an n type semiconductor increases with increase in temperature and increase in density of donor atoms.

Reason (R): Diffusion of carriers occurs in semiconductors.

Test: Electronic Devices & Circuits - 6 - Question 6

No load d.c. output will be least in case of

Test: Electronic Devices & Circuits - 6 - Question 7

When an electron breaks a covalent bond and moves away,

Test: Electronic Devices & Circuits - 6 - Question 8

A photo diode is

Test: Electronic Devices & Circuits - 6 - Question 9

In which condition does BJT behave like a closed switch?

Test: Electronic Devices & Circuits - 6 - Question 10

Germanium and Si phosphorus have their maximum spectral response in the

Test: Electronic Devices & Circuits - 6 - Question 11

No load d.c. output will be least in case of

Test: Electronic Devices & Circuits - 6 - Question 12

When an electron breaks a covalent bond and moves away,

Test: Electronic Devices & Circuits - 6 - Question 13

A photo diode is

Test: Electronic Devices & Circuits - 6 - Question 14

Germanium and Si phosphorus have their maximum spectral response in the

Test: Electronic Devices & Circuits - 6 - Question 15

In which condition does BJT behave like a closed switch?

Test: Electronic Devices & Circuits - 6 - Question 16

High purity copper is obtained by

Test: Electronic Devices & Circuits - 6 - Question 17

Photo electric emission can occur only if the frequency of light is more than threshold frequency.

Test: Electronic Devices & Circuits - 6 - Question 18

In a JFET the width of channel is controlled by

Test: Electronic Devices & Circuits - 6 - Question 19

The unit of thermal resistance of a semi-conductor device is

Test: Electronic Devices & Circuits - 6 - Question 20

Figure represents a

Test: Electronic Devices & Circuits - 6 - Question 21

For generating 1 MHz frequency signal, the most suitable circuit is

Test: Electronic Devices & Circuits - 6 - Question 22

A doped semi-conductor is called

Test: Electronic Devices & Circuits - 6 - Question 23

In n type MOSFET, the substrate

Test: Electronic Devices & Circuits - 6 - Question 24

The first and the last critical frequency of an RC driving point impedance function must respectively by

Test: Electronic Devices & Circuits - 6 - Question 25

The diffusion current is proportional to

Information about Test: Electronic Devices & Circuits - 6 Page
In this test you can find the Exam questions for Test: Electronic Devices & Circuits - 6 solved & explained in the simplest way possible. Besides giving Questions and answers for Test: Electronic Devices & Circuits - 6, EduRev gives you an ample number of Online tests for practice

Top Courses for Electrical Engineering (EE)

Download as PDF

Top Courses for Electrical Engineering (EE)