Test: Levels of Hardware Modelling - Computer Science Engineering (CSE) MCQ

Explanation: While testing any devices or embedded systems, we apply some selected inputs which is known as the test pattern and observe the output. This output is compared with the expected output. The test patterns are normally applied to the already manufactured systems.

Explanation: For testing any devices or embedded systems, we use some sort of selected inputs which is known as the test pattern and observe the output and is compared with the expected output. This test patterns are normally applied to the manufactured systems.

Explanation: The test pattern generation is normally based on the fault models and this model is also known as the stuck-at model. The test pattern is based on certain assumption, that is why it is called as the stuck-at model.

Explanation: The test pattern generation is basically based on the fault models and this type of model is also known as the stuck-at model. These test patterns are based on certain assumption, hence it is known as the stuck-at model.

Explanation: The quality of the test pattern can be evaluated on the basis of the fault coverage. It is the percentage of potential faults that can be found for a given test pattern set, that is fault coverage equals the number of detectable faults for a given test pattern set divided by the number of faults possible due to the fault model.

Explanation: The design of testability or DfT is the process of designing for the better testability.

Explanation: The JTAG is a technique for connecting scan chains of several chips and is also known as boundary scan.

Explanation: The BILBO or the built-in logic block observer is proposed as a circuit combining, test response compaction, test pattern generation, and serial input/output capabilities.

Explanation: The CRC or the cyclic redundancy check is the error detecting code which is commonly used in the storage device and the digital networks.

Explanation: The FSM is the finite state machine. It will be having a finite number of states and is used to design both the sequential logic circuit and the computer programs. It can be used for testing the scan design in the testing techniques.