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Test: Sequential Circuits- 1 - Computer Science Engineering (CSE) MCQ


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10 Questions MCQ Test GATE Computer Science Engineering(CSE) 2025 Mock Test Series - Test: Sequential Circuits- 1

Test: Sequential Circuits- 1 for Computer Science Engineering (CSE) 2024 is part of GATE Computer Science Engineering(CSE) 2025 Mock Test Series preparation. The Test: Sequential Circuits- 1 questions and answers have been prepared according to the Computer Science Engineering (CSE) exam syllabus.The Test: Sequential Circuits- 1 MCQs are made for Computer Science Engineering (CSE) 2024 Exam. Find important definitions, questions, notes, meanings, examples, exercises, MCQs and online tests for Test: Sequential Circuits- 1 below.
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Test: Sequential Circuits- 1 - Question 1

The time required for a pulse to change from 10 to 90 percent of its maximum value is defined as

Test: Sequential Circuits- 1 - Question 2

The clock signals are used in sequential logic circuits to

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Test: Sequential Circuits- 1 - Question 3

An n stage ripple counter can count up to

Detailed Solution for Test: Sequential Circuits- 1 - Question 3

An n stage ripple counter can count up to the binary value represented by the n-bits.
= 2n - 1

Test: Sequential Circuits- 1 - Question 4

A 2 MHz signal is applied to the input of a J-K flip-flop which is operating in the ‘toggle’ mode. The frequency of the signal at the output will be

Test: Sequential Circuits- 1 - Question 5

Register is a

Detailed Solution for Test: Sequential Circuits- 1 - Question 5

Register is consists of group of flip flop, with each flip-flop having 1 bit of information. Register acts as a temporary storage. Used for general purpose.

Test: Sequential Circuits- 1 - Question 6

Which of the following circuit is called latch

Test: Sequential Circuits- 1 - Question 7

T flip-flop is commonly used as

Test: Sequential Circuits- 1 - Question 8

When a J-K flip-flop is constructed from an SR flip-flop

Test: Sequential Circuits- 1 - Question 9

If in a shift resistor Q0 is fed back to input the resulting counter is

Test: Sequential Circuits- 1 - Question 10

The dynamic hazard problem occurs in

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