Test: Karnaugh Maps (K-Maps)

# Test: Karnaugh Maps (K-Maps) - Electrical Engineering (EE)

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## 10 Questions MCQ Test GATE Electrical Engineering (EE) 2023 Mock Test Series - Test: Karnaugh Maps (K-Maps)

Test: Karnaugh Maps (K-Maps) for Electrical Engineering (EE) 2023 is part of GATE Electrical Engineering (EE) 2023 Mock Test Series preparation. The Test: Karnaugh Maps (K-Maps) questions and answers have been prepared according to the Electrical Engineering (EE) exam syllabus.The Test: Karnaugh Maps (K-Maps) MCQs are made for Electrical Engineering (EE) 2023 Exam. Find important definitions, questions, notes, meanings, examples, exercises, MCQs and online tests for Test: Karnaugh Maps (K-Maps) below.
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Test: Karnaugh Maps (K-Maps) - Question 1

### A Karnaugh map (K-map) is an abstract form of ____________ diagram organized as a matrix of squares.

Detailed Solution for Test: Karnaugh Maps (K-Maps) - Question 1

A Karnaugh map (K-map) is an abstract form of Venn diagram organized as a matrix of squares, where each square represents a Maxterm or a Minterm.

Test: Karnaugh Maps (K-Maps) - Question 2

### The K-map based Boolean reduction is based on the following Unifying Theorem: A + A’ = 1.

Detailed Solution for Test: Karnaugh Maps (K-Maps) - Question 2

The given expression A +A’ = 1 is based on non-impact unifying theorem.

Test: Karnaugh Maps (K-Maps) - Question 3

### The prime implicant which has at least one element that is not present in any other implicant is known as ___________

Detailed Solution for Test: Karnaugh Maps (K-Maps) - Question 3

Essential prime implicants are prime implicants that cover an output of the function that no combination of other prime implicants is able to cover.

Test: Karnaugh Maps (K-Maps) - Question 4

Each group of adjacent Minterms (group size in powers of twos) corresponds to a possible product term of the given ___________

Detailed Solution for Test: Karnaugh Maps (K-Maps) - Question 4

Each group of adjacent Minterms (group size in powers of twos) corresponds to a possible product term of the given function.

Test: Karnaugh Maps (K-Maps) - Question 5

It should be kept in mind that don’t care terms should be used along with the terms that are present in ___________

Detailed Solution for Test: Karnaugh Maps (K-Maps) - Question 5

It should be kept in mind that don’t care terms should be used along with the terms that are present in minterms as well as maxterms which reduces the complexity of the boolean expression.

Test: Karnaugh Maps (K-Maps) - Question 6

There are ______ cells in a 4-variable K-map.

Detailed Solution for Test: Karnaugh Maps (K-Maps) - Question 6

There are 16 = (24) cells in a 4-variable K-map.

Test: Karnaugh Maps (K-Maps) - Question 7

Each product term of a group, w’.x.y’ and w.y, represents the ____________ in that group.

Detailed Solution for Test: Karnaugh Maps (K-Maps) - Question 7

In a minterm, each variable w, x or y appears once either as the variable itself or as the inverse. So, the given expression satisfies the property of Sum of Minterm.

Test: Karnaugh Maps (K-Maps) - Question 8

Product-of-Sums expressions can be implemented using ___________

Detailed Solution for Test: Karnaugh Maps (K-Maps) - Question 8

Product-of-Sums expressions can be implemented using 2-level OR-AND & NOR logic circuits.

Test: Karnaugh Maps (K-Maps) - Question 9

Don’t care conditions can be used for simplifying Boolean expressions in ___________

Detailed Solution for Test: Karnaugh Maps (K-Maps) - Question 9

Don’t care conditions can be used for simplifying Boolean expressions in K-maps which helps in pairing with 1/0.

Test: Karnaugh Maps (K-Maps) - Question 10

Using the transformation method you can realize any POS realization of OR-AND with only.

Detailed Solution for Test: Karnaugh Maps (K-Maps) - Question 10

Using the transformation method we can realize any POS realization of OR-AND with only NOR.

## GATE Electrical Engineering (EE) 2023 Mock Test Series

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## GATE Electrical Engineering (EE) 2023 Mock Test Series

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