Class 12 Exam  >  Class 12 Questions  >  Which of the following factors may be regarde... Start Learning for Free
Which of the following factors may be regarded as the main cause of lanthanide contraction?
(AIEEE 2005)
  • a)
    Greater shielding of 5d electron by 4f electrons
  • b)
    Poorer shielding of 5d electron by 4f electrons
  • c)
    Effective shielding of one of 4f electron by another in the subshell
  • d)
    Poor shielding of one of 4f electron by another in the subshell
Correct answer is option 'D'. Can you explain this answer?
Verified Answer
Which of the following factors may be regarded as the main cause of la...
Lanthanide contraction is due to poor shielding of one of 4f electron by another in the subshell.
View all questions of this test
Most Upvoted Answer
Which of the following factors may be regarded as the main cause of la...
Explanation:

The main cause of lanthanide contraction is the poor shielding of one 4f electron by another in the subshell.

The lanthanide series consists of elements with atomic numbers from 57 to 71, and they are characterized by the filling of the 4f subshell. As we move from left to right across the lanthanide series, there is an increase in the nuclear charge due to the addition of protons in the nucleus. This increase in nuclear charge results in a stronger attraction between the nucleus and the outermost electrons.

The lanthanide contraction refers to the decrease in atomic and ionic radii of the elements in the lanthanide series as we move from left to right. This decrease in size is primarily due to the poor shielding of one 4f electron by another in the subshell.

Shielding refers to the ability of inner electrons to reduce the effective nuclear charge felt by the outermost electrons. In the case of lanthanides, the 4f subshell is shielded by the 5s, 5p, and 5d subshells. However, the 4f electrons themselves do not shield each other effectively.

The 4f electrons are relatively ineffective at shielding each other because they are quite diffuse and have poor overlap with each other. As a result, the 4f electrons experience a relatively high effective nuclear charge from the nucleus, leading to a strong attraction and contraction of the electron cloud.

This poor shielding of one 4f electron by another in the subshell results in a higher effective nuclear charge experienced by the outermost electrons. As a result, the atomic and ionic radii of the lanthanide elements decrease as we move from left to right across the series.

Therefore, option D, which states that the poor shielding of one 4f electron by another in the subshell is the main cause of lanthanide contraction, is the correct answer.
Explore Courses for Class 12 exam

Similar Class 12 Doubts

Read the following text and answer the following questions on the basis of the same:Electron Microscope Electron microscopes use electrons to illuminate a sample. In Transmission Electron Microscopy (TEM), electrons pass through the sample and illuminate film or a digital camera.Resolution in microscopy is limited to about half of the wavelength of the illumination source used to image the sample. Using visible light the best resolution that can be achieved by microscopes is about ~200 nm. Louis de Broglie showed that every particle or matter propagates like a wave. The wavelength of propagating electrons at a given accelerating voltage can be determined byThus, the wavelength of electrons is calculated to be 3.88 pm when the microscope is operated at 100 keV, 2. 74 pm at 200 keV and 2.24 pm at 300 keV. However, because the velocities of electrons in an electron microscope reach about 70% the speed of light with an accelerating voltage of 200 keV, there are relativistic effects on these electrons. Due to this effect, the wavelength at 100 keV, 200 keV and 300 keV in electron microscopes is 3.70 pm, 2.51 pm and 1.96 pm, respectively.Anyhow, the wavelength of electrons is much smaller than that of photons (2.5 pm at 200 keV). Thus if electron wave is used to illuminate the sample, the resolution of an electron microscope theoretically becomes unlimited. Practically, the resolution is limited to ~0.1 nm due to the objective lens system in electron microscopes. Thus, electron microscopy can resolve subcellular structures that could not be visualized using standard fluorescences microscopy.Q. Why electron as wave is used in electron microscope to illuminate the sample?

Read the following text and answer the following questions on the basis of the same:Electron Microscope Electron microscopes use electrons to illuminate a sample. In Transmission Electron Microscopy (TEM), electrons pass through the sample and illuminate film or a digital camera.Resolution in microscopy is limited to about half of the wavelength of the illumination source used to image the sample. Using visible light the best resolution that can be achieved by microscopes is about ~200 nm. Louis de Broglie showed that every particle or matter propagates like a wave. The wavelength of propagating electrons at a given accelerating voltage can be determined byThus, the wavelength of electrons is calculated to be 3.88 pm when the microscope is operated at 100 keV, 2. 74 pm at 200 keV and 2.24 pm at 300 keV. However, because the velocities of electrons in an electron microscope reach about 70% the speed of light with an accelerating voltage of 200 keV, there are relativistic effects on these electrons. Due to this effect, the wavelength at 100 keV, 200 keV and 300 keV in electron microscopes is 3.70 pm, 2.51 pm and 1.96 pm, respectively.Anyhow, the wavelength of electrons is much smaller than that of photons (2.5 pm at 200 keV). Thus if electron wave is used to illuminate the sample, the resolution of an electron microscope theoretically becomes unlimited. Practically, the resolution is limited to ~0.1 nm due to the objective lens system in electron microscopes. Thus, electron microscopy can resolve subcellular structures that could not be visualized using standard fluorescences microscopy.Q. As the accelerating voltage increases, the wavelength of electron as wave

Which of the following factors may be regarded as the main cause of lanthanide contraction?(AIEEE 2005)a)Greater shielding of 5d electron by 4f electronsb)Poorer shielding of 5d electron by 4f electronsc)Effective shielding of one of 4f electron by another in the subshelld)Poor shielding of one of 4felectron by another in the subshellCorrect answer is option 'D'. Can you explain this answer?
Question Description
Which of the following factors may be regarded as the main cause of lanthanide contraction?(AIEEE 2005)a)Greater shielding of 5d electron by 4f electronsb)Poorer shielding of 5d electron by 4f electronsc)Effective shielding of one of 4f electron by another in the subshelld)Poor shielding of one of 4felectron by another in the subshellCorrect answer is option 'D'. Can you explain this answer? for Class 12 2024 is part of Class 12 preparation. The Question and answers have been prepared according to the Class 12 exam syllabus. Information about Which of the following factors may be regarded as the main cause of lanthanide contraction?(AIEEE 2005)a)Greater shielding of 5d electron by 4f electronsb)Poorer shielding of 5d electron by 4f electronsc)Effective shielding of one of 4f electron by another in the subshelld)Poor shielding of one of 4felectron by another in the subshellCorrect answer is option 'D'. Can you explain this answer? covers all topics & solutions for Class 12 2024 Exam. Find important definitions, questions, meanings, examples, exercises and tests below for Which of the following factors may be regarded as the main cause of lanthanide contraction?(AIEEE 2005)a)Greater shielding of 5d electron by 4f electronsb)Poorer shielding of 5d electron by 4f electronsc)Effective shielding of one of 4f electron by another in the subshelld)Poor shielding of one of 4felectron by another in the subshellCorrect answer is option 'D'. Can you explain this answer?.
Solutions for Which of the following factors may be regarded as the main cause of lanthanide contraction?(AIEEE 2005)a)Greater shielding of 5d electron by 4f electronsb)Poorer shielding of 5d electron by 4f electronsc)Effective shielding of one of 4f electron by another in the subshelld)Poor shielding of one of 4felectron by another in the subshellCorrect answer is option 'D'. Can you explain this answer? in English & in Hindi are available as part of our courses for Class 12. Download more important topics, notes, lectures and mock test series for Class 12 Exam by signing up for free.
Here you can find the meaning of Which of the following factors may be regarded as the main cause of lanthanide contraction?(AIEEE 2005)a)Greater shielding of 5d electron by 4f electronsb)Poorer shielding of 5d electron by 4f electronsc)Effective shielding of one of 4f electron by another in the subshelld)Poor shielding of one of 4felectron by another in the subshellCorrect answer is option 'D'. Can you explain this answer? defined & explained in the simplest way possible. Besides giving the explanation of Which of the following factors may be regarded as the main cause of lanthanide contraction?(AIEEE 2005)a)Greater shielding of 5d electron by 4f electronsb)Poorer shielding of 5d electron by 4f electronsc)Effective shielding of one of 4f electron by another in the subshelld)Poor shielding of one of 4felectron by another in the subshellCorrect answer is option 'D'. Can you explain this answer?, a detailed solution for Which of the following factors may be regarded as the main cause of lanthanide contraction?(AIEEE 2005)a)Greater shielding of 5d electron by 4f electronsb)Poorer shielding of 5d electron by 4f electronsc)Effective shielding of one of 4f electron by another in the subshelld)Poor shielding of one of 4felectron by another in the subshellCorrect answer is option 'D'. Can you explain this answer? has been provided alongside types of Which of the following factors may be regarded as the main cause of lanthanide contraction?(AIEEE 2005)a)Greater shielding of 5d electron by 4f electronsb)Poorer shielding of 5d electron by 4f electronsc)Effective shielding of one of 4f electron by another in the subshelld)Poor shielding of one of 4felectron by another in the subshellCorrect answer is option 'D'. Can you explain this answer? theory, EduRev gives you an ample number of questions to practice Which of the following factors may be regarded as the main cause of lanthanide contraction?(AIEEE 2005)a)Greater shielding of 5d electron by 4f electronsb)Poorer shielding of 5d electron by 4f electronsc)Effective shielding of one of 4f electron by another in the subshelld)Poor shielding of one of 4felectron by another in the subshellCorrect answer is option 'D'. Can you explain this answer? tests, examples and also practice Class 12 tests.
Explore Courses for Class 12 exam
Signup for Free!
Signup to see your scores go up within 7 days! Learn & Practice with 1000+ FREE Notes, Videos & Tests.
10M+ students study on EduRev