Physics Exam > Physics Videos > Solid State Physics, Devices & Electronics > Crystal Structure - 6 (Planar density, Close-Packed Structures, Stacking Faults)
Crystal Structure - 6 (Planar density, Close-Packed Structures, Stacking Faults) Video Lecture | Solid State Physics, Devices & Electronics
FAQs on Crystal Structure - 6 (Planar density, Close-Packed Structures, Stacking Faults) Video Lecture - Solid State Physics, Devices & Electronics
| 1. What is planar density in crystal structures? |  |
Ans. Planar density is a measure of how closely packed atoms or ions are in a crystal structure within a specific plane. It is calculated by dividing the total number of atoms or ions within a given plane by the area of that plane.
| 2. What are close-packed structures in crystallography? | |
Ans. Close-packed structures refer to crystal structures where the atoms or ions are arranged in a closely packed manner, maximizing the efficiency of space filling. Two common types of close-packed structures are the hexagonal close-packed (hcp) and face-centered cubic (fcc) structures.
| 3. How are stacking faults formed in crystal structures? | |
Ans. Stacking faults occur when there is a disruption in the regular stacking sequence of close-packed planes in a crystal structure. This can happen due to defects or errors during crystal growth or when different crystal structures are stacked on top of each other in a layered arrangement.
| 4. What are the consequences of stacking faults in crystal structures? | |
Ans. Stacking faults can affect the mechanical, electrical, and optical properties of materials. They can lead to changes in crystal symmetry, alter the arrangement of atoms or ions, and create localized strain fields. These effects can influence the material's strength, conductivity, and other properties.
| 5. How are stacking faults characterized and studied in crystallography? | |
Ans. Stacking faults can be studied using techniques such as X-ray diffraction, transmission electron microscopy (TEM), and scanning tunneling microscopy (STM). These methods allow researchers to analyze the crystal structure at the atomic level and identify the presence and nature of stacking faults.
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