Can you provide the previous year's cutoff for the SSC CHSL Tier-II Ex...
Previous Year's Cutoff for SSC CHSL Tier-II Exam
The SSC CHSL (Combined Higher Secondary Level) Exam is conducted by the Staff Selection Commission (SSC) to recruit candidates for various posts such as Lower Divisional Clerk (LDC), Data Entry Operator (DEO), Postal Assistant (PA), and Sorting Assistant (SA) in various government departments and offices. The exam is conducted in multiple stages, and the Tier-II Exam is an important stage that candidates need to qualify to move forward in the selection process.
The cutoff marks for the SSC CHSL Tier-II Exam vary each year depending on several factors such as the number of vacancies, the difficulty level of the exam, and the number of candidates appearing for the exam. However, to give you an idea of the previous year's cutoff, here are the details:
SSC CHSL Tier-II Exam Cutoff 2019:
- General Category: 134 marks out of 200
- OBC Category: 133 marks out of 200
- SC Category: 122.5 marks out of 200
- ST Category: 112 marks out of 200
- EWS Category: 127 marks out of 200
- OH Category: 98 marks out of 200
- HH Category: 56 marks out of 200
- VH Category: 110 marks out of 200
It is important to note that these cutoff marks are subject to change each year based on the aforementioned factors. Therefore, candidates must aim to score as high as possible to increase their chances of qualifying for the next stage of the SSC CHSL Exam.
To prepare for the Tier-II Exam, candidates should focus on practicing and improving their writing skills, as the exam primarily tests their ability to write an essay and a letter/application. They should also familiarize themselves with the exam pattern, syllabus, and previous year's question papers to understand the level of difficulty and the type of questions asked.
In conclusion, the cutoff marks for the SSC CHSL Tier-II Exam vary each year. Candidates should aim to score high and focus on improving their writing skills to increase their chances of qualifying for the next stage of the exam.