Chemical Mechanical Polisihing is used to:a)Remove silicon oxideb)Remo...
The pad oxide and nitride are removed using a Chemical Mechanical Polishing (CMP) step.
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Chemical Mechanical Polisihing is used to:a)Remove silicon oxideb)Remo...
Chemical Mechanical Polishing (CMP) is a widely used technique in the semiconductor industry to planarize surfaces and remove unwanted layers. It involves the simultaneous application of chemical and mechanical forces to achieve a high level of surface flatness and smoothness. CMP is a critical process in the fabrication of integrated circuits as it helps to improve device performance and yield.
Removal of Silicon Nitride and Pad Oxide:
One of the main applications of CMP is the removal of silicon nitride and pad oxide layers from the surface of the wafer. Silicon nitride (Si3N4) is commonly used as a dielectric material for insulating layers, while pad oxide is a thin layer of silicon dioxide (SiO2) that acts as a buffer between the silicon substrate and subsequent layers.
During the fabrication process, these layers may need to be removed to expose the underlying layers for further processing or to prepare the surface for subsequent layer deposition. CMP is an effective method for selectively removing these layers without damaging the underlying structures.
Chemical and Mechanical Forces:
CMP involves the combination of chemical and mechanical forces to achieve material removal. A slurry containing abrasive particles and chemical agents is applied to the surface of the wafer, and a polishing pad is used to apply mechanical pressure. As the wafer undergoes rotational and linear motion, the abrasive particles in the slurry physically abrade the surface, while the chemical agents react with the material to enhance removal.
Planarization and Surface Quality:
In addition to layer removal, CMP also plays a crucial role in achieving surface planarity and smoothness. The mechanical forces applied during CMP help to level out any height variations or topographical features on the wafer surface. This is important for subsequent lithography and deposition processes, as it ensures uniformity and accuracy in pattern formation.
The combination of chemical and mechanical forces in CMP allows for precise control over the removal rate and selectivity of different materials. This enables the removal of specific layers, such as silicon nitride and pad oxide, while preserving the integrity of the underlying structures. CMP has become an essential process in semiconductor manufacturing, contributing to the production of high-performance integrated circuits.