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 Which is not suitable for circuits having large N values?
  • a)
    exhaustive test pattern method
  • b)
    pseudo-exhaustive test pattern method
  • c)
    random test pattern method
  • d)
    deterministic test pattern method
Correct answer is option 'A'. Can you explain this answer?
Verified Answer
Which is not suitable for circuits having large N values?a)exhaustive ...
 Exhaustive test pattern method is not suitable for circuit having large N values since there is a limit for fault coverage.
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Which is not suitable for circuits having large N values?a)exhaustive test pattern methodb)pseudo-exhaustive test pattern methodc)random test pattern methodd)deterministic test pattern methodCorrect answer is option 'A'. Can you explain this answer?
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