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Consider the following statements:1. By increasing the rate of recombination and removal of minority carrier, reverse recovery period can be reduced.2. In fast recovery diode, rate of recombination is decreased.3. MOSFET and transistors are used in high power applications.4. IGBT is having all the good properties of a transistors and MOSFET.Which of the statements given above are correct?a)1 and 4b)1, 2, 3 and 4c)2 and 3d)1,2 and 3Correct answer is option 'A'. Can you explain this answer? for Electrical Engineering (EE) 2024 is part of Electrical Engineering (EE) preparation. The Question and answers have been prepared
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the Electrical Engineering (EE) exam syllabus. Information about Consider the following statements:1. By increasing the rate of recombination and removal of minority carrier, reverse recovery period can be reduced.2. In fast recovery diode, rate of recombination is decreased.3. MOSFET and transistors are used in high power applications.4. IGBT is having all the good properties of a transistors and MOSFET.Which of the statements given above are correct?a)1 and 4b)1, 2, 3 and 4c)2 and 3d)1,2 and 3Correct answer is option 'A'. Can you explain this answer? covers all topics & solutions for Electrical Engineering (EE) 2024 Exam.
Find important definitions, questions, meanings, examples, exercises and tests below for Consider the following statements:1. By increasing the rate of recombination and removal of minority carrier, reverse recovery period can be reduced.2. In fast recovery diode, rate of recombination is decreased.3. MOSFET and transistors are used in high power applications.4. IGBT is having all the good properties of a transistors and MOSFET.Which of the statements given above are correct?a)1 and 4b)1, 2, 3 and 4c)2 and 3d)1,2 and 3Correct answer is option 'A'. Can you explain this answer?.
Solutions for Consider the following statements:1. By increasing the rate of recombination and removal of minority carrier, reverse recovery period can be reduced.2. In fast recovery diode, rate of recombination is decreased.3. MOSFET and transistors are used in high power applications.4. IGBT is having all the good properties of a transistors and MOSFET.Which of the statements given above are correct?a)1 and 4b)1, 2, 3 and 4c)2 and 3d)1,2 and 3Correct answer is option 'A'. Can you explain this answer? in English & in Hindi are available as part of our courses for Electrical Engineering (EE).
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Here you can find the meaning of Consider the following statements:1. By increasing the rate of recombination and removal of minority carrier, reverse recovery period can be reduced.2. In fast recovery diode, rate of recombination is decreased.3. MOSFET and transistors are used in high power applications.4. IGBT is having all the good properties of a transistors and MOSFET.Which of the statements given above are correct?a)1 and 4b)1, 2, 3 and 4c)2 and 3d)1,2 and 3Correct answer is option 'A'. Can you explain this answer? defined & explained in the simplest way possible. Besides giving the explanation of
Consider the following statements:1. By increasing the rate of recombination and removal of minority carrier, reverse recovery period can be reduced.2. In fast recovery diode, rate of recombination is decreased.3. MOSFET and transistors are used in high power applications.4. IGBT is having all the good properties of a transistors and MOSFET.Which of the statements given above are correct?a)1 and 4b)1, 2, 3 and 4c)2 and 3d)1,2 and 3Correct answer is option 'A'. Can you explain this answer?, a detailed solution for Consider the following statements:1. By increasing the rate of recombination and removal of minority carrier, reverse recovery period can be reduced.2. In fast recovery diode, rate of recombination is decreased.3. MOSFET and transistors are used in high power applications.4. IGBT is having all the good properties of a transistors and MOSFET.Which of the statements given above are correct?a)1 and 4b)1, 2, 3 and 4c)2 and 3d)1,2 and 3Correct answer is option 'A'. Can you explain this answer? has been provided alongside types of Consider the following statements:1. By increasing the rate of recombination and removal of minority carrier, reverse recovery period can be reduced.2. In fast recovery diode, rate of recombination is decreased.3. MOSFET and transistors are used in high power applications.4. IGBT is having all the good properties of a transistors and MOSFET.Which of the statements given above are correct?a)1 and 4b)1, 2, 3 and 4c)2 and 3d)1,2 and 3Correct answer is option 'A'. Can you explain this answer? theory, EduRev gives you an
ample number of questions to practice Consider the following statements:1. By increasing the rate of recombination and removal of minority carrier, reverse recovery period can be reduced.2. In fast recovery diode, rate of recombination is decreased.3. MOSFET and transistors are used in high power applications.4. IGBT is having all the good properties of a transistors and MOSFET.Which of the statements given above are correct?a)1 and 4b)1, 2, 3 and 4c)2 and 3d)1,2 and 3Correct answer is option 'A'. Can you explain this answer? tests, examples and also practice Electrical Engineering (EE) tests.