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Consider the following statements:
1. By increasing the rate of recombination and removal of minority carrier, reverse recovery period can be reduced.
2. In fast recovery diode, rate of recombination is decreased.
3. MOSFET and transistors are used in high power applications.
4. IGBT is having all the good properties of a transistors and MOSFET.
Which of the statements given above are correct?
  • a)
    1 and 4
  • b)
    1, 2, 3 and 4
  • c)
    2 and 3
  • d)
    1,2 and 3
Correct answer is option 'A'. Can you explain this answer?
Verified Answer
Consider the following statements:1. By increasing the rate of recombi...
  • In fast recovery diode, reverse recovery time is reduced by addition of gold or platinum due to which rate of recombination is increased. Hence, statements-2 is not correct.
  • MOSFET and transistor are used in low and medium power applications. Thus, statements-3 is not correct.
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Most Upvoted Answer
Consider the following statements:1. By increasing the rate of recombi...
Statement 1: By increasing the rate of recombination and removal of minority carrier, reverse recovery period can be reduced.
Explanation:
- Reverse recovery refers to the time it takes for a diode to switch from the conducting state to the non-conducting state when the voltage polarity across the diode is reversed.
- During the reverse recovery period, the minority carriers (electrons in P-type material and holes in N-type material) that were injected into the diode during the forward conduction have to be removed before the diode can fully block the reverse voltage.
- Increasing the rate of recombination and removal of minority carriers can reduce the reverse recovery period.
- This can be achieved by using techniques such as adding a high reverse voltage across the diode during the reverse recovery period or using a fast recovery diode that has optimized design and material properties to enhance carrier recombination and removal.
- Therefore, statement 1 is correct.

Statement 2: In fast recovery diode, rate of recombination is decreased.
Explanation:
- The rate of recombination in a fast recovery diode is actually increased, not decreased.
- Fast recovery diodes are designed to have a low reverse recovery time by reducing the amount of minority carrier charge stored in the diode during forward conduction.
- This is achieved by optimizing the diode structure and doping profiles to enhance the rate of recombination of minority carriers.
- By increasing the rate of recombination, the stored charge in the diode is quickly depleted during the reverse recovery period, reducing the reverse recovery time.
- Therefore, statement 2 is incorrect.

Statement 3: MOSFET and transistors are used in high power applications.
Explanation:
- MOSFETs (Metal-Oxide-Semiconductor Field-Effect Transistors) and transistors are commonly used in various electronic applications, including high power applications.
- MOSFETs are particularly suitable for high power applications due to their ability to handle high voltage and current levels with low power dissipation.
- They are commonly used in power amplifiers, power converters, motor control circuits, and other high power electronic systems.
- Transistors, such as bipolar junction transistors (BJTs) and insulated gate bipolar transistors (IGBTs), are also used in high power applications.
- BJTs are commonly used in high power amplifiers, switching circuits, and voltage regulators.
- IGBTs combine the advantages of both MOSFETs and BJTs, making them suitable for high power applications that require high voltage and current handling capabilities.
- Therefore, statement 3 is correct.

Statement 4: IGBT is having all the good properties of a transistor and MOSFET.
Explanation:
- IGBTs (Insulated Gate Bipolar Transistors) are a type of transistor that combines the characteristics of both MOSFETs and BJTs.
- They have the high input impedance and voltage control characteristics of MOSFETs, along with the high current and gain characteristics of BJTs.
- IGBTs are capable of handling high voltage and current levels, making them suitable for high power applications.
- They have lower on-state losses compared to BJTs, making them more efficient in high power applications.
- Therefore, statement 4 is correct
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Consider the following statements:1. By increasing the rate of recombination and removal of minority carrier, reverse recovery period can be reduced.2. In fast recovery diode, rate of recombination is decreased.3. MOSFET and transistors are used in high power applications.4. IGBT is having all the good properties of a transistors and MOSFET.Which of the statements given above are correct?a)1 and 4b)1, 2, 3 and 4c)2 and 3d)1,2 and 3Correct answer is option 'A'. Can you explain this answer?
Question Description
Consider the following statements:1. By increasing the rate of recombination and removal of minority carrier, reverse recovery period can be reduced.2. In fast recovery diode, rate of recombination is decreased.3. MOSFET and transistors are used in high power applications.4. IGBT is having all the good properties of a transistors and MOSFET.Which of the statements given above are correct?a)1 and 4b)1, 2, 3 and 4c)2 and 3d)1,2 and 3Correct answer is option 'A'. Can you explain this answer? for Electrical Engineering (EE) 2024 is part of Electrical Engineering (EE) preparation. The Question and answers have been prepared according to the Electrical Engineering (EE) exam syllabus. Information about Consider the following statements:1. By increasing the rate of recombination and removal of minority carrier, reverse recovery period can be reduced.2. In fast recovery diode, rate of recombination is decreased.3. MOSFET and transistors are used in high power applications.4. IGBT is having all the good properties of a transistors and MOSFET.Which of the statements given above are correct?a)1 and 4b)1, 2, 3 and 4c)2 and 3d)1,2 and 3Correct answer is option 'A'. Can you explain this answer? covers all topics & solutions for Electrical Engineering (EE) 2024 Exam. Find important definitions, questions, meanings, examples, exercises and tests below for Consider the following statements:1. By increasing the rate of recombination and removal of minority carrier, reverse recovery period can be reduced.2. In fast recovery diode, rate of recombination is decreased.3. MOSFET and transistors are used in high power applications.4. IGBT is having all the good properties of a transistors and MOSFET.Which of the statements given above are correct?a)1 and 4b)1, 2, 3 and 4c)2 and 3d)1,2 and 3Correct answer is option 'A'. Can you explain this answer?.
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