The primary function of Atomic Force Microscopy (AFM) is force measurement. AFM is a powerful tool used in nanotechnology and materials science to investigate the surface properties of a sample at the atomic scale. It provides high-resolution images and precise measurements of forces between the probe and the sample.

What is Atomic Force Microscopy (AFM)?
Atomic Force Microscopy (AFM) is a scanning probe microscopy technique that uses a sharp probe to scan the surface of a sample. The probe is mounted on a cantilever, which deflects as it interacts with the sample surface. The deflection is measured and used to generate an image of the sample surface.

Force Measurement
The primary function of AFM is force measurement. AFM measures the forces between the probe and the sample surface, providing valuable information about the sample's mechanical properties. The forces measured by AFM include:

1. Van der Waals forces: These are attractive forces between atoms and molecules that exist even when they are not in direct contact. AFM can measure the strength of these forces, which is important for understanding the adhesion and cohesion properties of materials.

2. Electrostatic forces: AFM can measure the electrostatic forces between charged particles. This is useful for studying the electrical properties of materials and characterizing the behavior of charged surfaces.

3. Magnetic forces: AFM can also measure the magnetic forces between a magnetic probe and a magnetic sample. This is important for studying magnetic materials and investigating magnetic interactions at the nanoscale.

4. Chemical forces: AFM can provide information about the chemical interactions between the probe and the sample surface. This is useful for studying surface chemistry and understanding the behavior of molecules on a nanoscale.

By measuring these forces, AFM can provide valuable insights into the physical and chemical properties of a sample at the atomic scale. This information can be used to characterize materials, study surface processes, investigate biological systems, and design new nanoscale devices.

In summary, the primary function of Atomic Force Microscopy (AFM) is force measurement. AFM provides high-resolution images and precise measurements of forces between the probe and the sample, allowing researchers to investigate the surface properties of a sample at the atomic scale.

Atomic Force Microscopy (AFM) has three major functions: force measurement, imaging, and manipulation. Force measurement is one of its primary functions, as it can measure the forces between the probe and the sample, as explained in the text.