Finite State Machine (FSM) for developing test patterns

Finite State Machine (FSM) is a mathematical model used to represent and analyze the behavior of a system. It consists of a set of states, inputs, outputs, and transition rules. FSMs are commonly used in digital circuit design and testing.

Algorithmic Test Pattern
An algorithmic test pattern is a method for generating test patterns based on a predefined algorithm or set of rules. It involves systematically applying test vectors to the circuit under test in order to detect faults or verify its functionality.

Deterministic Test Pattern
Deterministic test patterns are generated using a specific algorithm or set of rules to test a circuit. These patterns are designed to cover all possible scenarios and transitions in the circuit, ensuring that all states and transitions are exercised.

Random Test Pattern
Random test patterns, as the name suggests, are generated randomly without following any specific algorithm. These patterns are useful for detecting faults that may not be covered by deterministic or algorithmic patterns. However, they may not provide complete coverage of all possible scenarios in the circuit.

Exhaustive Test Pattern
Exhaustive test patterns aim to test all possible combinations of inputs and states in a circuit. This method involves generating test patterns to cover all possible input combinations and transitions, ensuring that every possible scenario is tested. While exhaustive testing provides the highest degree of coverage, it is often impractical or infeasible for large circuits due to the exponential growth in the number of possible test patterns.

Algorithmic Test Pattern using FSM
The correct answer to the question is option 'B' - algorithmic test pattern. This method utilizes a finite state machine (FSM) to develop the test pattern. The FSM model is used to define the states and transitions of the circuit under test. Based on this model, an algorithm is developed to generate the test patterns that systematically cover the desired test conditions.

By using an FSM for test pattern development, the algorithmic approach ensures that all possible states and transitions in the circuit are tested. It provides a systematic and controlled way of generating test patterns, making it easier to analyze the test coverage and detect faults.

In summary, the algorithmic test pattern method utilizes a finite state machine (FSM) to develop test patterns that systematically cover all possible states and transitions in a circuit. This approach ensures comprehensive test coverage, making it a valuable technique in digital circuit design and testing.