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A non-ideal Si-based pi: junction diode is tested by sweeping the bias applied across its terminals from -5 V to +5 V. The effective thermal voltage, VT, for the diode is measured to be (29 ± 2) mV. The resolution of the voltage source in the measurement range is 1 mV. The percentage uncertainty (rounded off to 2 decimal plates) in the measured current at a bias voltage of 0.02 V is _______.Correct answer is '5.87'. Can you explain this answer? for GATE 2024 is part of GATE preparation. The Question and answers have been prepared according to the GATE exam syllabus. Information about A non-ideal Si-based pi: junction diode is tested by sweeping the bias applied across its terminals from -5 V to +5 V. The effective thermal voltage, VT, for the diode is measured to be (29 ± 2) mV. The resolution of the voltage source in the measurement range is 1 mV. The percentage uncertainty (rounded off to 2 decimal plates) in the measured current at a bias voltage of 0.02 V is _______.Correct answer is '5.87'. Can you explain this answer? covers all topics & solutions for GATE 2024 Exam. Find important definitions, questions, meanings, examples, exercises and tests below for A non-ideal Si-based pi: junction diode is tested by sweeping the bias applied across its terminals from -5 V to +5 V. The effective thermal voltage, VT, for the diode is measured to be (29 ± 2) mV. The resolution of the voltage source in the measurement range is 1 mV. The percentage uncertainty (rounded off to 2 decimal plates) in the measured current at a bias voltage of 0.02 V is _______.Correct answer is '5.87'. Can you explain this answer?.

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